JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**
JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino & Richard Y. Wang & James D. Funk **Mint Condition**.
JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino & Richard Y. Wang & James D. Funk **Mint Condition**.
Publisher : The MIT Press. Publication Date : Aug 21 2009.
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