JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino Mint

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SKU: FAerHUUG

GTIN: 9780262513357

Condition: Like New

Tags: 0.5 in 0262513358 11 Oz 2009 240 Pages 6.3 in 8.9 in 9780262513357 Computers English Journey to Data Quality MIT Press Quality Press Textbook Trade Paperback

Categories: Textbooks, Education & Reference

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ISBN-10	0262513358
Genre	COMPUTERS
ISBN	9780262513357
Publication Name	Journey to Data Quality
Publisher	MIT Press
Item Length	8.9 in
Publication Year	2009
Type	Textbook
Format	Trade Paperback
Language	English
Item Height	0.5 in
Item Weight	11 Oz
Item Width	6.3 in
Number Of Pages	240 Pages

JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino & Richard Y. Wang & James D. Funk **Mint Condition**.

JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino Mint

JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino Mint

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JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**

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JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino Mint