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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

USD 17.00 USD
SKU: yFurTvWU
GTIN: 9780262513357
Condition: Good
Tags: 0.5 in 11 Oz 2009 240 Pages 6.3 in 8.9 in 9780262513357 English Journey to Data Quality MIT Press Quality Press Textbook Trade Paperback
Categories: Textbooks, Education & Reference

Specifications

ISBN9780262513357
Publication NameJourney to Data Quality
PublisherMIT Press
Item Length8.9 in
Publication Year2009
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.5 in
Item Weight11 Oz
Item Width6.3 in
Number Of Pages240 Pages

Publisher : The MIT Press. Publication Date : Aug 21 2009.

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